CESH-e (Enhanced Controlled Environment Sample Holder)

Features

• Quick and easy sample mounting/dismounting
• Compatible with through-plane and In-plane electrical measurements
• Reliable and highly reproducible mechanical pressure (100 N provided by default, 6 N provided with thickness measurement kit option)
• Modular electrode setup with many interchangeable electrodes
• Optional kit for sample thickness measurements
• Variable controlled atmospheres (inert & active gas)
• Compatible with oxygen and moisture sensitive materials thanks to its gas tightness
• Compatible with temperature chambers (-40 °C to 150 °C)
• Guarded and unguarded electrode setup
• Compatible with powder, pasty, hard, flexible, and compressible materials

The CESH-e is often used in conjunction with the ITS-e Temperature Chamber. For more details, please click here.

Applications

• Electrical Impedance spectroscopy
• Dielectric constant / dielectric loss
• In-plane and through-plane electrical measurement

The Enhanced Controlled Environment Sample Holder (CESH-e) is a parallel plate sample holder dedicated to the electrical characterization of flat material samples in the temperature range between -40 to 150 °C. Thanks to its modular electrodes setup, the CESH-e allows Through-plane and In-plane electrical measurements using interchangeable electrodes. For through-plane measurements the CESH-e can be configured in two ways: an unguarded electrode setup for routine measurement and a guarded electrode setup for conductivity measurements in compliance with ASTM D257 standard and accurate dielectric measurements as per the ASTM D-150 standard.

(Left) In-plane / (Right) Trough-plane

A thickness measurement kit including a micrometer head with a calibrated ratchet is provided as an option to ensure the accurate measurement of the thickness of the sample as per ASTM D374. The CESH-e and thickness measurement kit enables reproducible pressure (100 N or 6 N respectively) and so repeatable contact between the CESH-e electrodes and the sample. The thickness measurement kit allows the CESH-e to apply a nominal and reproducible pressure of 190 kPa with the ¼’’ electrode. It also enables tests on flexible and compressible materials.

The CESH-e can be used either with circular or rectangular sample shapes. It is compatible with gelatinous, pasty, hard, flexible, and compressible materials.

Electrodes

The CESH-e can accommodate various sample diameters (1/4’’ to 30 mm) and thicknesses (0-4 mm).

Three electrodes kits are offered for each measurement type. Each electrode kit of (Through Plane and In-Plane) consists of two electrodes: an upper electrode and a lower electrode.

In-plane		Through plane
10 mm	097-150/IPSD (standard)	20 mm diameter	097-150/TP20
250 µm	097-150/IP250	1/2″ diameter	097-150/TP12
100 µm	097-150/IP100	1/4″ diameter	097-150/TP06

The CESH-e is equipped with a gas inlet/outlet for material testing in continuous flow mode or in static mode. It is leak-tight up to 2 bar relative.

Options

• Sample thickness measurement kit
• Through-plan electrodes with ¼”, ½” and 20mm diameter
• Standard & Interdigitated electrodes (100µm and 250 µm spacing)
• PT-1000 Temperature probe
• MTZ-35 Impedance analyzer
• BioLogic potentiostat/galvanostat/FRA

Specifications

• Operating temperature range – 40 to 150 °C
• Core material: Anodized aluminum
• Electrode material: Gold plated copper
• Dimension D 79 x H 94 mm (121.90 clearance)
• Sample diameter up to 30 mm
• Sample thickness up to 4 mm
• Residual capacitance with 20mm diameter= 8 pF
• Weight 900 g