SCAN-Lab Technical Notes 12: ac-SECM and LEIS: differences and similarities

Introduction

Alternating Current  Scanning Electrochemical Microscopy (ac-SECM) and Localized Electrochemical Impedance Spectroscopy (LEIS) both allow local impedance information from a sample to be measured. This technical note explains the advantages and drawbacks of the two scanning impedance techniques that are offered in the M470: ac-SECM (offered with dc-SECM) and LEIS.