Product support 5 min read

M470

Latest updated: October 28, 2024

BioLogic regularly creates a wide variety of technical and applicative support documentation – information designed to help our clients with their projects and research. These technical and applicative support communications are generated both via propositions from our own internal experts, and client feedback.

This information is available in a wide range of formats including: Applications and Technical notes, “How-to” videos, Tutorials, Frequently asked questions, white papers and articles.

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M470 Scanning Electrochemical Workstation Software

Control and analysis software for the M470/M370 scanning workstations.

Product support 5 min read

M470

Download software.

M470 Scanning Electrochemical Workstation Software

3DIsoPlot

MIRA: Microscopic Image Rapid Analysis

Manuals.

M470 - LEIS Manuals

Documentation.

Application notes

Graphical and analysis tools in M370/M470 software <em><span>Scanning Probes – </span> Application Note 8</em>

Height tracking with the SKP370 or SKP470 module <em><span>Scanning Probes – </span> Application Note 1</em>

SECM height relief with OSP: An application in corrosion <em><span>Scanning Probes – </span> Application Note 2</em>

SECM height relief with OSP: an application in sensors <em><span>Scanning Probes – </span> Application Note 3</em>

Post-treatment and optimization of area scan experiments <em><span>Scanning Probes – </span> Application Note 4</em>

Introducing the Microscopic Image Rapid Analysis (MIRA) software <em><span>Scanning Probes – </span> Application Note 5</em>

Advantages of the intermittent contact SECM : two examples in corrosion <em><span>Scanning Probes – </span> Application Note 6</em>

ac-SECM to investigate battery electrode materials in non-aqueous electrolyte <em><span>Scanning Probes – </span> Application Note 7</em>

SKP imaging example of a corroded Zn-plated Fe sample <em><span>Scanning Probes – </span> Application Note 9</em>

dc- and ac-SECM Measurements on Si Nanowire Arrays <em><span>Scanning Probes – </span> Application Note 10</em>

Measurement of a nano-patterned gold sample by ic-/ac-SECM <em><span>Scanning Probes – </span> Application Note 11</em>

3D Map production using the 3DIsoPlot software<em><span>Scanning Probes – </span> Application Note 12</em>

Investigation of an interdigitated array electrode using ic-SECM <em><span>Scanning Probes – </span> Application Note 13</em>

Introduction to the Modular Map Experiment: an Interdigitated Array electrode example <em><span>Scanning Probes – </span> Application Note 14</em>

Introduction to the USB-PIO: measuring the effect of light on a live leaf <em><span>Scanning Probes – </span> Application Note 15</em>

Intermittent Contact (ic) SECM for relief of major topographic features <em><span>Scanning Probes – </span> Application Note 16</em>

The use of height tracking SECM to measure mechanically exfoliated graphite <em><span>Scanning Probes – </span> Application Note 17</em>

Introduction to Foil Cell <em><span>Scanning Probes – </span> Application Note 20</em>

The use of the SVP470 for Vibrating Probe measurements of plants <em><span>Scanning Probes – </span> Application Note 22</em>

Technical notes

SCAN-Lab Technical Notes 01: Magnitudes and principles used in Scanning Vibrating Electrode Technique

SCAN-Lab Technical Notes 02: Practical methods to correlate the SVP voltage to a current at a sample’s surface

SCAN-Lab Technical Notes 05: Using custom probes for LEIS, SVP and SKP experiments

SCAN-Lab Technical Notes 06: Ultra Micro-Electrodes (UMEs) for SECM techniques

SCAN-Lab Technical Notes 07: M470 positioner : how high resolution and high accuracy are achieved

SCAN-Lab Technical Notes 09: 150 μm SKP probe: description, advantage and user’s guidelines

SCAN-Lab Technical Notes 10: The application of Gwyddion imaging software to M370/M470 results

SCAN-Lab Technical Notes 03: Relating Work Function Difference Measured by Scanning Kelvin Probe (SKP) to Corrosion Potential.

SCAN-Lab Technical Notes 04: The importance of the Counter Electrode in LEIS measurement

SCAN-Lab Technical Notes 08: Scanning Vibrating Electrode Technique (SVET): factors affecting the measurement

SCAN-Lab Technical Notes 11: Determining the probe diameter and RG ratio in an SECM experiment

SCAN-Lab Technical Notes 12: ac-SECM and LEIS: differences and similarities

SCAN-Lab Technical Notes 13: Connecting to the SP-300 by Ethernet connection (instead of USB)

SCAN-Lab Technical Notes 14: Height Tracking Inputs for SKP Investigations

SCAN-Lab Technical Notes 15: 5 μm SECM Probes: Description, Advantage, and User Guidelines

SCAN-Lab Technical Notes 16: Comparison of Saturated Calomel Electrode (SCE) and Silver/Silver Chlo-ride Electrode (Ag/AgCl) using the M470

SCAN-Lab Technical Notes 17: Preventing Damage by ElectroStatic Discharge

Brochures

M470 brochure